Sapphire statistical characterization and risk reduction program

Sapphire statistical characterization and risk reduction program

著者名:

McClure,D.R. ( U.S. Army Space and Missile Defense Command )

掲載資料名:

Window and dome technologies and materials VII : 16-17 April 2001, Orlando, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4375

発行年:

2001

開始ページ:

20

終了ページ:

30

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440709 [0819440701]

言語:

英語

請求記号:

P63600/4375

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012091
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Window and dome technologies and materials
回次:	2001 : 7th
会議開催地:	Orlando, FL, USA
会議開催年:	2001.04.16-2001.04.17

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