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Critical evaluation of test patterns for EO system performance characterization

著者名:
掲載資料名:
Infrared imaging systems : design, analysis, modeling, and testing XII : 18-19 April 2001, Orlando, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4372
発行年:
2001
開始ページ:
27
終了ページ:
38
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440679 [0819440671]
言語:
英語
請求記号:
P63600/4372
資料種別:
国際会議録

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