Blank Cover Image

Thermal diffusivity imaging with a moving line source

著者名:
掲載資料名:
Thermosense XXIII : 16-19 April 2001, Orlando, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4360
発行年:
2001
開始ページ:
606
終了ページ:
615
総ページ数:
10
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440556 [0819440558]
言語:
英語
請求記号:
P63600/4360
資料種別:
国際会議録

類似資料:

1 国際会議録 Thermographic detection and quantitative characterization of corrosion by application of thermal line source

Cramer,K.E., Winfree,W.P.

SPIE-The International Society for Optical Engineering
7 国際会議録 Thermal characterization of defects in aircraft structures via spatially controlled heat application

Cramer,K.E., Winfree,W.P.

SPIE-The International Society for Optical Engineering
2 国際会議録 Thermal diffusivity imaging of aerospace materials and structures

Winfree,W.P., Heath,D.M.

SPIE-The International Society for Optical Engineering
8 国際会議録 Computational pulse shaping for thermographic inspections

Winfree,W.P., Cramer,K.E.

SPIE-The International Society for Optical Engineering
3 国際会議録 Thermographic imaging of material loss in boiler water-wall tubing by application of scanning line source

Cramer,K.E., Winfree,W.P.

SPIE - The International Society for Optical Engineering
9 国際会議録 Single-sided thermal diffusivity imaging in composites with a shuttered thermographic inspection system

Winfree, W.P., Zalameda, J.N.

SPIE-The International Society for Optical Engineering
4 国際会議録 Application of the thermal line scanner to quantify material loss due to corrosion

Cramer,K.E., Winfree,W.P.

SPIE - The International Society for Optical Engineering
10 国際会議録 Status of thermal NDT of space shuttle materials at NASA [6205-50]

Cramer K. E., Winfree W. P., Hodges K., Koshti A., Ryan D., Reinhardt W. W.

SPIE - The International Society of Optical Engineering
5 国際会議録 Thermographic detection and quantitative characterization of corrosion by application of thermal line source

Cramer,K.E., Winfree,W.P., Reid,D., Johnson,J.

SPIE - The International Society for Optical Engineering
11 テクニカルペーパー Thermal diffusivity imaging of ceramic composites

Cramer, K. Elliott, Winfree, William P., Generazio, Edward R., Bhatt, Ramakrishna, Fox, Dennis S., Eckel, AndrewJ.

The American Society of Mechanical Engineers
6 国際会議録 Reduction of thermal data using neural networks

Winfree,W.P., Cramer,K.E.

SPIE - The International Society for Optical Engineering
12 国際会議録 A comparison of image processing algorithms for thermal nondestructive evaluation

Zalameda, J.N., Rajic, N., Winfree, W.P.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12