Infrared light irradiation diminishes effective charge transfer in slow sodium channel gating system

Infrared light irradiation diminishes effective charge transfer in slow sodium channel gating system

著者名:

Plakhova,V.B. ( I.P. Pavlov Institute of Physiology )

掲載資料名:

Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4348

発行年:

2000

開始ページ:

143

終了ページ:

145

総ページ数:

3

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440372 [081944037X]

言語:

英語

請求記号:

P63600/4348

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012064
シリーズID:	PA00000029
会議名:	International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering
回次:	2000 : 4th
会議開催地:	St. Petersburg, Russia
会議開催年:	2000.06.12-2000.06.17

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