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Non-Destructive Evaluation of CSP Reliability using Scanning Acoustic Microscopy

著者名:
Stradling,Jim ( Sonix, Inc. )  
掲載資料名:
Proceedings : 2000 International Symposium on Microelectronics, September 20-22, 2000, Hynes Convention Center, Boston, Massachusetts
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4339
発行年:
2000
開始ページ:
778
終了ページ:
783
総ページ数:
6
出版情報:
Reston, VA: IMAPS
ISSN:
0277786X
ISBN:
9780930815622 [0930815629]
言語:
英語
請求記号:
P63600/4339
資料種別:
国際会議録

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