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High Reliability Interconnection Technology using Conductive Adhesive

著者名:
Mitani,Tsutomu ( Matsushita Electric Industrial Co., Ltd. )
Takezawa,Hiroaki
Ishimaru,Yukihiro
Kitae,Takashi
Itagaki,Minehiro
Bessho,Yoshihiro
さらに 1 件
掲載資料名:
Proceedings : 2000 International Symposium on Microelectronics, September 20-22, 2000, Hynes Convention Center, Boston, Massachusetts
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4339
発行年:
2000
開始ページ:
737
終了ページ:
742
総ページ数:
6
出版情報:
Reston, VA: IMAPS
ISSN:
0277786X
ISBN:
9780930815622 [0930815629]
言語:
英語
請求記号:
P63600/4339
資料種別:
国際会議録

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