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Far-infrared characterization of GaN epilayers

著者名:
掲載資料名:
Smart optical inorganic structures and devices : 16-19 August 2000, Vilnius, Lithuania
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4318
発行年:
2000
開始ページ:
109
終了ページ:
116
総ページ数:
8
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440006 [0819440000]
言語:
英語
請求記号:
P63600/4318
資料種別:
国際会議録

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