Photocurrent estimation from multiple nondestructive samples in CMOS image sensor

Photocurrent estimation from multiple nondestructive samples in CMOS image sensor

著者名:

Liu,X. ( Stanford Univ. )
Gamal,A.El

掲載資料名:

Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4306

発行年:

2001

開始ページ:

450

終了ページ:

458

総ページ数:

9

出版情報:

Bellingham, Washington: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439840 [0819439843]

言語:

英語

請求記号:

P63600/4306

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012022
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Sensors and camera systems for scientific, industrial, and digital photography applications
回次:	2001 : 2nd
会議開催地:	San Jose, CA, USA
会議開催年:	2001.01.22-2001.01.24

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