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Design of radiation hard CMOS APS image sensors in a 0.35-μm standard process

著者名:
Eid,E.-S. ( Photobit Corp. )
Chan,T.Y.
Fossum,E.R.
Tsai,R.H.
Spagnuolo,R.
Deily,J.J.
さらに 1 件
掲載資料名:
Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4306
発行年:
2001
開始ページ:
50
終了ページ:
59
総ページ数:
10
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439840 [0819439843]
言語:
英語
請求記号:
P63600/4306
資料種別:
国際会議録

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