Resolution enhancement using a diffraction grating for optical triangulation displacement sensors

Resolution enhancement using a diffraction grating for optical triangulation displacement sensors

著者名:

Oh,S.B. ( Korea Advanced Institute of Science and Technology )
Kim,K.-C.
Kim,S.H.
Kwak,Y.K.

掲載資料名:

Testing, Reliability, and Applications of Optoelectronic Devices

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4285

発行年:

2001

開始ページ:

102

終了ページ:

108

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439635 [0819439630]

言語:

英語

請求記号:

P63600/4285

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012001
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Testing, reliability, and applications of optoelectronic devices
回次:	2001
会議開催地:	San Jose, CA, USA
会議開催年:	2001.01.24-2001.01.26

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4 国際会議録 Multi-degree-of-freedom displacement measurement system using a diffraction grating Kim,J.-A., Kim,K.-C., Bae,E.W., Kim,S., Kwak,Y.K. SPIE - The International Society for Optical Engineering	10 国際会議録 Formation of multiple gratings in a photorefractive crystal using a single diffractive mask Han, S.H., Park, J.H., Kim, H., Yang, B.C., Paek, J.W., Lee, B.H. SPIE-The International Society for Optical Engineering
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