Evaluation of an optical surface using nanometrology in optical manufacturing technology

Evaluation of an optical surface using nanometrology in optical manufacturing technology

著者名:

掲載資料名:

Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4231

発行年:

2000

開始ページ:

566

終了ページ:

568

総ページ数:

3

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439048 [0819439045]

言語:

英語

請求記号:

P63600/4231

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00011949
シリーズID:	PA00000029
会議名:	Advanced Optical Manufacturing and Testing Technology
回次:	2000
会議開催地:	Chengdu, China
会議開催年:	2000.11.01-2000.11.03

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