Improvement of tapping-mode scanning near-field optical microscope
- 著者名:
Zhuo,W. Li,Q. Sun,J. Xu,J. Zhao,J. Guo,J. - 掲載資料名:
- Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4223
- 発行年:
- 2000
- 開始ページ:
- 23
- 終了ページ:
- 26
- 総ページ数:
- 4
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438942 [0819438944]
- 言語:
- 英語
- 請求記号:
- P63600/4223
- 資料種別:
- 国際会議録
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