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Application of wavelet transform in image measurement

著者名:
掲載資料名:
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4221
発行年:
2000
開始ページ:
315
終了ページ:
320
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438928 [0819438928]
言語:
英語
請求記号:
P63600/4221
資料種別:
国際会議録

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