Blank Cover Image

Submicron electro-optic measurement technique using an external hemispherical probe

著者名:
Chen,Z.
Jia,G.
Wu,X.
Liu,Y.
Zhao,C.
Yi,M.
さらに 1 件
掲載資料名:
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4221
発行年:
2000
開始ページ:
189
終了ページ:
192
総ページ数:
4
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438928 [0819438928]
言語:
英語
請求記号:
P63600/4221
資料種別:
国際会議録

類似資料:

1 国際会議録 Research of spatial resolution in external electro-optic probing

Zhang, H.B., Wang, R., Chen, K.X., Yang, H., Zhang, D.M., Yi, M.B.

SPIE-The International Society for Optical Engineering
7 国際会議録 Research on the electro-induced birefingence in bulk crystal silicon

Y.-H. Zhang, H. Liu, Z.-G. Chen, G. Jia, C. Ren

Society of Photo-optical Instrumentation Engineers
2 国際会議録 Poling of organic polymer films for external electro-optic measurement

Hou,A., Zhang,D., Chen,K., Yi,M.

SPIE - The International Society for Optical Engineering
8 国際会議録 An accurate scatter measurement and correction technique for cone beam breast CT imaging using scanning sampled measurement (SSM)technique [6142-112]

Liu, X., Shaw, C. C., Wang, T., Chen, L., Altunbas, M. C., Kappadath, S. C.

SPIE - The International Society of Optical Engineering
3 国際会議録 Tiny gallium arsenide probe for electro-optic sampling

Li, H.L., Zhang, X.T., Chen, Z.G., Jia, G., Zhou, Z.X.

SPIE-The International Society for Optical Engineering
9 国際会議録 Noise analyzer of laser diode in electro-optic sampling

X. Wang, Y.C. Wang, G.F. Chen

Society of Photo-optical Instrumentation Engineers
4 国際会議録 Free-space electro-optic and magneto-optic samplings

Campbell,P., Li,M., Lu,Z.G., Riordan,J.A., Stewart,K.R., Wagoner,G.A., Wu,Q.J., Zhang,X.-C.

SPIE-The International Society for Optical Engineering
10 国際会議録 Longitudinal electro-optic modulation using a poled polymer film in a Fabry-Perot cavity

Chen, K., Yang, H., Zhang, H., Zhang, D., Yi, M.

SPIE-The International Society for Optical Engineering
5 国際会議録 Probing Process-induced Defects in Si Using Infrared Photoelastic Stress Measurement Technique

Liu, X.H., Wong, S.P., Peng, H.J., Ke, N., Zhao, Shounan

Materials Research Society
11 国際会議録 Nanoscale displacement measurement of MEMS devices using fiber optic interferometry

Lee, C.W., Zhang, X.M., Tjin, S.C., Liu, A.Q.

SPIE-The International Society for Optical Engineering
6 国際会議録 Measurement of deep modulation index of M-Z electro-optic modulator by using optical spectrum analyzer

Yi,H., Wu,B., Zhou,W., Li,Y., Yang,H., Zhang,B., Peng,J.M.

SPIE-The International Society for Optical Engineering
12 国際会議録 Investigation of Mechanical and Structural Properties of AlN Thin Films Prepared by Mid-Frequency Pulsed Magnetron Sputtering

Z.X. Mu, A.M. Wu, L. Jia, Z.W. Wang, H.Y. Zhao, S.G. Liu

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12