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Single-scan method for determination of the thickness and optical constant of thin metal film

著者名:
Zhang,A.
Yuan,B.
Cao,Z.
Shen,Q.
Dou,X.
Chen,Y.
Tashiro,H.
さらに 2 件
掲載資料名:
Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4220
発行年:
2000
開始ページ:
130
終了ページ:
134
総ページ数:
5
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438911 [081943891X]
言語:
英語
請求記号:
P63600/4220
資料種別:
国際会議録

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