Single-scan method for determination of the thickness and optical constant of thin metal film
- 著者名:
Zhang,A. Yuan,B. Cao,Z. Shen,Q. Dou,X. Chen,Y. Tashiro,H. - 掲載資料名:
- Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4220
- 発行年:
- 2000
- 開始ページ:
- 130
- 終了ページ:
- 134
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438911 [081943891X]
- 言語:
- 英語
- 請求記号:
- P63600/4220
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Real-time measurement for the electro-optic coefficient of a poled-polymer film in ATR configuration
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
国際会議録
Highly sensitive method for concentration and sbsorption measurements by guided-wave resonance
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
国際会議録
Double-channel polymer electro-optic modulators in an attenuated total reflection configuration
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
国際会議録
Real-time monitoring of thin films' optical thickness at shut-turning point with fuzzy logic
Society of Photo-optical Instrumentation Engineers |
6
国際会議録
Determination of the optical constants and thickness of titanium oxide thin film by envelope method
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |