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Scaling a 3D vision system from automobiles down to circuit board inspection: Issues in small field-of-view inspection

著者名:
掲載資料名:
Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4189
発行年:
2000
開始ページ:
110
終了ページ:
121
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438546 [0819438545]
言語:
英語
請求記号:
P63600/4189
資料種別:
国際会議録

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