Dual-mask model-based proximity correction for high-performance 0.10-μm CMOS process
- 著者名:
Palmer,S.R. Mason,M.E. Randall,J.N. Aton,T. Kim,K. Tritchkov,A.V. Burdorf,J. Rieger,M.L. Stirniman,J.P. - 掲載資料名:
- 20th Annual BACUS Symposium on Photomask Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4186
- 発行年:
- 2000
- 開始ページ:
- 921
- 終了ページ:
- 932
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438492 [0819438499]
- 言語:
- 英語
- 請求記号:
- P63600/4186
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Optical proximity effects correction at 0.25ヲフm incorporating process variations in lithography
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |