Effect of beam blur in mask fabrication
- 著者名:
Yang,S.-H. Ki,W.-T. Moon,S.-Y. Jeong,T.-M. Choi,S.-W. Han,W.-S. Sohn,J.-M. - 掲載資料名:
- 20th Annual BACUS Symposium on Photomask Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4186
- 発行年:
- 2000
- 開始ページ:
- 468
- 終了ページ:
- 473
- 総ページ数:
- 6
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438492 [0819438499]
- 言語:
- 英語
- 請求記号:
- P63600/4186
- 資料種別:
- 国際会議録
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6
国際会議録
Dose-modulation-induced mask CD error on simultaneous correction of fogging and loading effect
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SPIE-The International Society for Optical Engineering |