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Characterization of copper oxidation and reduction using spectroscopic ellipsometry

著者名:
Powell,R.A.
Settles,D.
Lane,L.
Ygartua,C.L.
Srivatsa,A.R.
Hayzelden,C.
さらに 1 件
掲載資料名:
Process Control and Diagnostics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4182
発行年:
2000
開始ページ:
97
終了ページ:
105
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438430 [081943843X]
言語:
英語
請求記号:
P63600/4182
資料種別:
国際会議録

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