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In-flight calibration of the EOS Multiangle Imaging Spectroradiometer (MISR)

著者名:
掲載資料名:
Sensors, systems, and next-generation satellites IV : 25-28 September 2000, Barcelona, Spain
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4169
発行年:
2000
開始ページ:
36
終了ページ:
46
総ページ数:
11
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438256 [0819438251]
言語:
英語
請求記号:
P63600/4169
資料種別:
国際会議録

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