Blank Cover Image

Far Ultravioiet Spectroscopic Expiorer optlcal system: lessons learned

著者名:
Conard,S.J.
Barkhouser,R.H.
Evans,J.P.
Friedman,S.D.
Kruk,J.W.
Moos,H.W.
Ohl,R.G.
Sahnow,D.J.
さらに 3 件
掲載資料名:
Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4139
発行年:
2000
開始ページ:
186
終了ページ:
198
総ページ数:
13
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437846 [0819437840]
言語:
英語
請求記号:
P63600/4139
資料種別:
国際会議録

類似資料:

Friedman,S.D., Conard,S.J., Barkhouser,R.H., Brownsberger,K.R., Cha,A.N., Fullerton,A.W., Kruk,J.W., Moos,W., …

SPIE - The International Society for Optical Engineering

Sahnow,D.J., Moos,H.W., Ake,T.B., Andersson,B.-G., Andre,M., Artis,D., Berman,A.F., Blair,W.P., Brownsberger,K.R., …

SPIE - The International Society for Optical Engineering

Ohl,R.G., Barkhouser,R.H., Conard,S.J., Friedman,S.D., Hampton,J., Moos,H.W., Nikulla,P., Oliveira,C.M., Saha,T.T.

SPIE-The International Society for Optical Engineering

Sahnow,D.J., Friedman,S.D., Moos,H.W., Green,J.C., Siegmund,O.H.W.

SPIE-The International Society for Optical Engineering

Sahnow,D.J., Moos,H.W., Friedman,S.D., Blair,W.P., Conard,S.J., Kruk,J.W., Murphy,E.M., Oegerle,W.R., Ake,T.B.

SPIE-The International Society for Optical Engineering

Conard,S.J., Redman,K.W., Barkhouser,R.H., Johnson,J.A.

SPIE - The International Society for Optical Engineering

Ohl,R.G., Friedman,S.D., Saha,T.T., Barkhouser,R.H., Moos,H.W.

SPIE - The International Society for Optical Engineering

Oliveira,C.M., Retherford,K., Conard,S.J., Barkhouser,R.H., Friedman,S.D.

SPIE - The International Society for Optical Engineering

Ohl,R.G., Barkhouser,R.H., Kennedy,M.J., Friedman,S.D.

SPIE-The International Society for Optical Engineering

Sahnow,D.J., Friedman,S.D., Oegerle,W.R., Moos,H.W., Green,J.C., Siegmund,O.H.W.

SPIE-The International Society for Optical Engineering

Conard,S.J., Redman,K.W., Barkhouser,R.H., McGuffey,D.B., Smee,S., Ohl,R.G., Kushner,G.D.

SPIE - The International Society for Optical Engineering

Kennedy,M.J., Friedman,S.D., Barkhouser,R.H., Hampton,J., Nikulla,P.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12