Measurements with the Chandra X-Ray Observatory's flight contamination monitor
- 著者名:
Elsner,R.F. Kolodziejczak,J.J. O'Dell,S.L. Swartz,D.A. Tennant,A.F. Weisskopf,M.C. - 掲載資料名:
- X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4138
- 発行年:
- 2000
- 開始ページ:
- 1
- 終了ページ:
- 9
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437839 [0819437832]
- 言語:
- 英語
- 請求記号:
- P63600/4138
- 資料種別:
- 国際会議録
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