Single-event upset studies of a high-speed digital optical data link
- 著者名:
Lundquist,J.M. Andrieux,M.L. Dinkespiler,B. Evans,G.A. Ganllin-Martel,L. Pearce,M. Rethore,F. Stroynowski,R. Ye,J. - 掲載資料名:
- Photonics for space environments VII : 31 July - 1 August 2000, San Diego, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4134
- 発行年:
- 2000
- 開始ページ:
- 194
- 終了ページ:
- 205
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819437792 [0819437794]
- 言語:
- 英語
- 請求記号:
- P63600/4134
- 資料種別:
- 国際会議録
類似資料:
American Institute of Aeronautics and Astronautics |
Society of Photo-optical Instrumentation Engineers |
Society of Automotive Engineers |
SPIE - The International Society of Optical Engineering |
Society of Automotive Engineers |
9
国際会議録
Single Event Upset Sensitivity of a SRAM: An Overview from Testing Procedures to Device Hardening
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Society of Automotive Engineers |
Society of Automotive Engineers |