Design and Plans for a wide-field imaging Interferometry testbed

Design and Plans for a wide-field imaging Interferometry testbed

著者名:

掲載資料名:

Imaging spectrometry VI : 31 July - 2 August 2000, San Diego, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4132

発行年:

2000

開始ページ:

365

終了ページ:

371

総ページ数:

7

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437778 [0819437778]

言語:

英語

請求記号:

P63600/4132

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00011857
シリーズID:	PA00000029
会議名:	Optics & Photonics : Imaging Spectrometry
回次:	2000 : 6th
会議開催地:	San Diego, CA, USA
会議開催年:	2000.07.31-2000.08.02

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