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Atomic Scale Force Mapping with the Atomic Force Microscope

著者名:
掲載資料名:
Forces in scanning probe methods
シリーズ名:
NATO ASI series. Series E, Applied sciences
シリーズ巻号:
286
発行年:
1995
開始ページ:
543
終了ページ:
549
総ページ数:
7
出版情報:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792334064 [079233406X]
言語:
英語
請求記号:
N11482/286
資料種別:
国際会議録

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