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Wavelet-based two-dimensional corner detection

著者名:
掲載資料名:
Optical Pattern Recognition X
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3715
発行年:
1999
開始ページ:
281
終了ページ:
288
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431899 [0819431893]
言語:
英語
請求記号:
P63600/3715
資料種別:
国際会議録

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