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Rote of p-doping profile in InGaAsP multiquantum well lasers:comparison of simulation and experiment

著者名:
Hybertsen,M.S. ( Lucent Technologies/Bell Labs. )
Alam,M.A.
Shtengel,G.E.
Belenky,G.L.
Reynolds,C.L.,Jr.
Donetsky,D.V.
Smith,R.K.
Baraff,G.A.
Kazarinov,R.F.
Wynn,J.D.
Smith,L.E.
さらに 6 件
掲載資料名:
Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3625
発行年:
1999
開始ページ:
524
終了ページ:
534
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430953 [0819430951]
言語:
英語
請求記号:
P63600/3625
資料種別:
国際会議録

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