Evaluation of residual stress gradients by diffraction methods with wavelets:a neural network approach

Evaluation of residual stress gradients by diffraction methods with wavelets:a neural network approach

著者名:

Wern,H. ( Hochschule fur Technik und Wirtschaft des Saarlandes )
Ringeisen,M.

掲載資料名:

Nondestructive evaluation of aging Materials and Composites III : 3-5 March 1999, Newport Beach, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3585

発行年:

1999

開始ページ:

318

終了ページ:

328

出版情報:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819430557 [0819430552]

言語:

英語

請求記号:

P63600/3585

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020858
シリーズID:	PA00000029
会議名:	Smart Structures : Nondestructive Evaluation of Aging Materials and Composites
回次:	1999 : 3rd
会議開催地:	Newport Beach, CA, USA
会議開催年:	1999.03.03-1999.03.05

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