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Shearography system for the testing of large-scale aircraft components taking into account noncooperative surfaces

著者名:
Osten,W. ( Bremer Institut fur angewandte Strahltechnik )
Kalms,M.K.
Juptner,W.P.O.
Tober,G.
Bisle,W.
Scherling,D.
さらに 1 件
掲載資料名:
Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4101
発行年:
2000
巻:
Part B
開始ページ:
432
終了ページ:
438
出版情報:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437464 [0819437468]
言語:
英語
請求記号:
P63600/4101
資料種別:
国際会議録

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