Correlation between gate induced drain leakage and plasma induced interface traps
- 著者名:
Ma, Siguang Zhang, Yaohui Li, M. F. Li, Weidan Wang, J. L. F. Yen, Andrew C. Sheng, George T. T. - 掲載資料名:
- Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 592
- 発行年:
- 2000
- 開始ページ:
- 117
- 出版情報:
- Warrendale, PA: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558995000 [1558995005]
- 言語:
- 英語
- 請求記号:
- M23500/592
- 資料種別:
- 国際会議録
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