CHEMICAL STABILITY OF REACTIVELY SPUTTERED AlN WITH PLASMA ENHANCED CHEMICAL VAPOR DEPOSITED SiO2 AND SiNx
- 著者名:
- 掲載資料名:
- Polycrystalline thin films : structure, texture, properties, and applications : symposium held April 4-8, 1994, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 343
- 発行年:
- 1994
- 開始ページ:
- 253
- 出版情報:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992436 [155899243X]
- 言語:
- 英語
- 請求記号:
- M23500/343
- 資料種別:
- 国際会議録
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1
国際会議録
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Materials Research Society |
SPIE - The International Society of Optical Engineering |
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SPIE-The International Society for Optical Engineering |
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MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |