Software metric-based neural network classification models of a very large telecommunications system

Software metric-based neural network classification models of a very large telecommunications system

著者名:

Khoshgoftaar,T.M. ( Florida Atlantic Univ. )
Allen,E.B.
Hudepohl,J.P.
Aud,S.J.

掲載資料名:

Applications and science of artificial neural networks II : 9-12 April, 1996, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2760

発行年:

1996

開始ページ:

634

終了ページ:

645

出版情報:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421418 [0819421413]

言語:

英語

請求記号:

P63600/2760

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020767
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Applications and Science of Artificial Neural Networks
回次:	1996 : 2nd
会議開催地:	Orlando, FL, USA
会議開催年:	1996.04.09-1996.04.12

類似資料:

1 国際会議録 Improving neural network models of defect content in complex software systems Lanning,D.L., Khoshgoftaar,T.M., Guasti,P.J. SPIE-The International Society for Optical Engineering	7 国際会議録 Application of neural networks and knowledge-based systems for automatic identification of fault-indicating fringe patterns W.P. Jüptner, T.M. Kreis, U. Mieth, W. Osten Society of Photo-optical Instrumentation Engineers
2 国際会議録 Neural network application in support of software reliability engineering T.M. Khoshgoftaar, D.L. Lanning, A.S. Pandya Society of Photo-optical Instrumentation Engineers	8 国際会議録 Data flow system for the very large telescope interferometer Ballester,P., Chavan,A.M., Cotton,B., Foresto,V.Coude du, Glindemann,A., Guirao,C., Jaffe,W., Kervella,P., … SPIE-The International Society for Optical Engineering
3 国際会議録 Spectral quality metrics for terrain classification Kerekes, J.P., Hsu, S.M. SPIE - The International Society of Optical Engineering	9 国際会議録 Neural-network-based parts classification for SMT processes Kim,B.M., Cho,H.S. SPIE-The International Society for Optical Engineering
4 国際会議録 Neural network based automated texture classification system Rughooputh,H.C.S., Rughooputh,S.D.D.V., Kinser,J.M. SPIE - The International Society for Optical Engineering	10 国際会議録 Automated fault detection and classification of etch systems using modular neural networks Hong, S.J., May, G.S., Yamartino, J., Skumanich, A. SPIE - The International Society of Optical Engineering
5 国際会議録 Processing speckle patterns with model-trained neural networks Decker,A.J., Fite,E.B., Mehmed,O., Thorp,S.A. SPIE-The International Society for Optical Engineering	11 テクニカルペーパー Neural networks for modelling aircraft noise radiation Pietrzko, S.J. American Institute of Aeronautics and Astronautics
6 国際会議録 Methodology for designing image similarity metrics based on human visual system models Frese,T., Bouman,C.A., Allebach,J.P. SPIE-The International Society for Optical Engineering	12 国際会議録 Fault detection in a mechanical system by neural networks M.D. Thomas, S.J. Flockton Society of Photo-optical Instrumentation Engineers

1

2

3

4

5

6

7

8

9

10

11

12