Modeling and measuring the response times of thin film TiNi

Modeling and measuring the response times of thin film TiNi

著者名:

Ho,K.K. ( Univ.of California/Los Angeles )
Jardine,P.
Carman,G.P.
Kim,C.J.

掲載資料名:

Smart structures and materials 1997 : Smart materials technologies : 3-4 March 1997, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3040

発行年:

1997

開始ページ:

10

終了ページ:

22

出版情報:

Bellingham: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819424532 [0819424536]

言語:

英語

請求記号:

P63600/3040

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020765
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	1997
会議開催地:	San Diego, CA, USA
会議開催年:	1997.03.03-1997.03.04

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