Fluorescence-lifetime imaging microscopy with a high-repetition gated camera and a dual-view assembly for real-time measurement

Fluorescence-lifetime imaging microscopy with a high-repetition gated camera and a dual-view assembly for real-time measurement

著者名:

Itoh,H. ( Hamamatsu Photonics K.K. )

掲載資料名:

Advances in fluorescence sensing technology III : 9-11 February 1997, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2980

発行年:

1997

開始ページ:

12

終了ページ:

19

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819423917 [0819423912]

言語:

英語

請求記号:

P63600/2980

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020759
シリーズID:	PA00000029
会議名:	SPIE BiOS : Advances in Fluorescence Sensing Technology
回次:	1997 : 3rd
会議開催地:	San Jose, CA, USA
会議開催年:	1997.02.09-1997.02.11

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