Low-Cost Parallel MCM Interconnect Test on Large Area Substrates
- 著者名:
- Sasidhar,K. ( Georgia Institute of Technology )
- Kim,B.
- Chatterjee,A.
- Swaminathan,M.
- 掲載資料名:
- 1996 International Symposium on Microelectronics : 8-10 October 1996, Minneapolis Convention Center, Minneapolis, Minnesota
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2920
- 発行年:
- 1996
- 開始ページ:
- 218
- 終了ページ:
- 223
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780930815486 [0930815483]
- 言語:
- 英語
- 請求記号:
- P63600/2920
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society | |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
国際会議録
Development of a technology for fabricating low-cost parallel optical interconnects [6185-07]
SPIE - The International Society of Optical Engineering |