Thermal Transient Testing

Thermal Transient Testing

著者名:

Szekely,Vladimir ( Technical University of Budapest )
Rencz,M.
Courtois,B.

掲載資料名:

1996 International Symposium on Microelectronics : 8-10 October 1996, Minneapolis Convention Center, Minneapolis, Minnesota

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2920

発行年:

1996

開始ページ:

18

終了ページ:

23

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780930815486 [0930815483]

言語:

英語

請求記号:

P63600/2920

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020753
シリーズID:	PA00000029
会議名:	International Symposium on Microelectronics
回次:	1996
会議開催地:	Minneapolis, Minnesota, USA
会議開催年:	1996.10.08-1996.10.10

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1 国際会議録 New Tools and Methods for the Thermal Transient Testing of Packages Rencz,Marta, Farkas,G., Szekely,Vladimir, Poppe,A., Courtois,Bernard SPIE-The International Society for Optical Engineering	7 国際会議録 Microsystem design framework based on tool adaptations and library developments Karam,J.-M., Courtois,B., Rencz,M., Poppe,A., Szekely,V. SPIE-The International Society for Optical Engineering
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