Photoluminescence and x-ray studies of thin layers down to single quantum wells

Photoluminescence and x-ray studies of thin layers down to single quantum wells

著者名:

Svitelskiy,A.V. ( Institute of Semiconductor Physics )
Semenova,G.N.
Klad'ko,V.P.
Kryshtab,T.G.

掲載資料名:

International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2648

発行年:

1995

開始ページ:

325

終了ページ:

332

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420213 [0819420212]

言語:

英語

請求記号:

P63600/2648

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020726
シリーズID:	PA00000029
会議名:	International Conference on Optical Diagnostics of Materials and Devices for Opto -, Micro-, and Quantum Electronics
回次:	1995
会議開催地:	Kiev, Ukraine
会議開催年:	1995.05.11-1995.05.13

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