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Developing a new method of the optical diagnostics materials for opto-,micro-,and quantum electronics based on semiconductor superlattices

著者名:
掲載資料名:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2648
発行年:
1995
開始ページ:
48
終了ページ:
56
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420213 [0819420212]
言語:
英語
請求記号:
P63600/2648
資料種別:
国際会議録

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