Photoluminescence and Raman Scatiering Characterization of GaN,InGaN aBd AlGaN Films Using a UV Excitation Raman-Photoluminescence Microscope
- 著者名:
Feng,Z.C. Schurman,M. Tran,C.A. Salagaj,T. Karlicek,B. Ferguson,I. Stall,R.A. Dyer,C.D. Williams,K.P.J. Pitt,G.D. - 掲載資料名:
- Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 264-268
- 発行年:
- 1998
- 巻:
- Part2
- 開始ページ:
- 1359
- 終了ページ:
- 1362
- 出版情報:
- Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497928 [0878497927]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
Electrochemical Society |
Electrochemical Society |
MRS - Materials Research Society |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |