Thermal-Wave Imaging:A Non-Destructive Technique to Characterize the Electromigration on Al Alloy
- 著者名:
- 掲載資料名:
- Nondestructive characterization of materials VII : proceedings of the seventh International Symposium on Nondestructive Characterization of Materials held in Prague, Czech Republic, June 1995
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 210-213
- 発行年:
- 1996
- パート:
- 1
- 開始ページ:
- 309
- 終了ページ:
- 316
- 出版情報:
- Zuerich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497089 [0878497080]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
MRS - Materials Research Society |
Electrochemical Society |
3
国際会議録
A SIMPLE, NON-DESTRUCTIVE OPTICAL TECHNIQUE TO CHARACTERIZE ION-IMPLANTED SEMICONDUCTOR WAFERS
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |