H Interacting with Intrinsic Defects in Si

H Interacting with Intrinsic Defects in Si

著者名:

Nielsen,B.Bech

掲載資料名:

Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995

シリーズ名:

Materials science forum

シリーズ巻号:

196-201

発行年:

1995

パート:

2

開始ページ:

933

終了ページ:

938

出版情報:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497164 [0878497161]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020219
シリーズID:	PA00000012
会議名:	International Conference on Defects in Semiconductors : ICDS
回次:	18th
会議開催地:	Sendai, Japan
会議開催年:	1995.07.23-1995.07.28

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2 国際会議録 The hydrogen-saturated self-interstitial iu silicon and germanium Budde,M., Nielsen,B.Bech, Leary,P., Goss,J., Jones,R., Briddon,P.R., Oberg,S., Breuer,S.J. Trans Tech Publications	8 国際会議録 Excitation Spectrum of the Interstitial Iron Donor in Silicon Olajos,J., Nielsen,B.Bech, Kleverman,M., Omling,P., Emanuelsson,O., Grimmeiss,H.G. Trans Tech Publications
3 国際会議録 Local vibrational modes of a weakly bound O-H complexes in Si.(Invited) Nielsen,B.Bech, Tanderup,K., Budde,M., Nieisen,K.Bonde, Lindstrom,J.L., Jones,R., Oberg,S., Hourahine,B., Briddon,P. Trans Tech Publications	9 国際会議録 The NNO Defect in Silicon Rasmussen,F.Berg, Oberg,S., Jones,R., Ewels,C., Goss,J., Miro,J., Deak,P. Trans Tech Publications
4 国際会議録 Observation and Theory of the H2 Defect in Silicon Nielsen,B.Bech, Holbech,J.D., Jones,R., Sitch,P., Oberg,S.(invited) Trans Tech Publications	10 国際会議録 Low-temperature migration of hydrcgen and iuteractioll with oxygen Nielsen,K.Bonde, Nielsen,B.Bech, Hansen,J. Trans Tech Publications
5 国際会議録 Substitutional carbon in Ge and Si1-xGex Hoffmann,L., Bach,J.C., Hansen,J.Lundsgaard, Larsen,A.Nylandsted, Nielsen,B.Bech, Leary,P., Jones,R., Oberg,S. Trans Tech Publications	11 国際会議録 Identification of VH in silicon by EPR Johannesen,P., Byberg,J.R., Nielsen,B.Bech, Stallinga,P., Nielsen,K.Bonde Trans Tech Publications
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