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Erbium in Silicon:A Defect System for Optoelectronic Integrated Circuits

著者名:
Michel,J.
Palm,J.
Gan,F.
Ren,F.Y.G.
Zheng,B.
Dunham,S.T.
Kimerling,L.C.
さらに 2 件
掲載資料名:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
シリーズ名:
Materials science forum
シリーズ巻号:
196-201
発行年:
1995
パート:
2
開始ページ:
585
終了ページ:
590
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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