Blank Cover Image

OXYGEN ENDOR OF THERMAL DONORS IN SILICON.

著者名:
掲載資料名:
Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986
シリーズ名:
Materials science forum
シリーズ巻号:
10-12
発行年:
1986
巻:
Part3
開始ページ:
1009
終了ページ:
1014
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Bekman,H.H.P.Th., Gregorkiewicz,T., Ammerlaan,C.A.J.

Trans Tech Publications

Dirksen,R., Rasmussen,F.Berg, Gregorkiewicz,T., Ammerlaan,C.A.J.

Trans Tech Publications

Gregorkiewicz,T., Bekman,H.H.P.Th., Ammerlaan,C.A.J.

Trans Tech Publications

Altink, H. E., Gregorkiewicz, T., Ammerlaan, C. A. J.

Materials Research Society

Gregorkiewicz,T., Bekamn,H.H.P.Th., Ammerlaan,C.A.J., Knap,W., Brunel,L.C., Martinez,G.

Trans Tech Publications

Liesert,B.J.Heijmink, Gregorkiewicz,T., Ammerlaan,C.A.J.

Trans Tech Publications

Kaczor,P., Dobaczewski,L., Gregorkiewicz,T., Ammerlaan,C.A.J.

Trans Tech Publications

Martynov,Yu.V., Gregorkiewicz,T., Ammeriaan,C.A.J.

Trans Tech Publications

Tsimperidis,I., Gregorkiewicz,T., Bekman,H.P.Th., Langerak,C.J.G.M., Ammerlaan,C.A.J.

Trans Tech Publications

Ammerlaan,C.A.J., Hai,P.N., Gregorkiewicz,T.

SPIE-The International Society for Optical Engineering

SIEVERTS,E.G., WEZEP,D.A.VAN, KEMP,R.VAN, AMMERLAAN,C.A.J.

Trans Tech Publications

de Krijger,A.J.T., Bekman,H.H.P.Th.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12