ON THE INFLUENCE OF DOPING AND ANNEALING ON OXYGEN-RELATED DEFECTS IN SILICON.

ON THE INFLUENCE OF DOPING AND ANNEALING ON OXYGEN-RELATED DEFECTS IN SILICON.

著者名:

掲載資料名:

Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986

シリーズ名:

Materials science forum

シリーズ巻号:

10-12

発行年:

1986

巻:

Part3

開始ページ:

869

終了ページ:

874

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878495511 [0878495517]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00020682
シリーズID:	PA00000012
会議名:	International Conference on Defects in Semiconductors - ICDS
回次:	14th
会議開催地:	Paris, France
会議開催年:	1986.08.18-1986.08.22

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2 国際会議録 Effects of Boron Doping on the Annealing Characteristics of Cz-Silicon Puff,W., Mascher,P., Kerr,D., Dannefaer,S. Trans Tech Publications	8 国際会議録 Heat-treatment induced modifications of porous silicon Dannefaer,S., Wiebe,C., Kerr,D. Trans Tech Publications
3 国際会議録 Positron Annihilation in Electron Irradiated Silicon Mascher,P., Dannefaer,S., Kerr,D. Trans Tech Publications	9 国際会議録 THE INFLUENCE OF THERMAL TREATMENT ON DEFECT CHARACTERISTICS IN CZ-SILICON WAFERS INVESTIGAGED BY POSITRON ANNIHILATION SPECTROSCOPY Mascher, P., Puff, W., Hahn, S., Cho. K. H., Lee, B. Y. Materials Research Society
4 国際会議録 DEFECTS IN CZ-SILICON INVESTIGATED BY THE POSITRON ANNIHILATION TEHCNIQUES Dannefaer, S., Kerr, D. Materials Research Society	10 国際会議録 Defect Distribution Across 6-Inch CZ-Silicon Wafers Puff,W., Mascher,P., Hahn,S., Cho,K.H., Lee,B.Y. Trans Tech Publications
5 国際会議録 HEAT-TREATMENT INDUCED DEFECTS IN CZ-SILICON Dannefaer, S., Bretagnon, T., Abdurahman, K., Kerr, D., Hahn, S. Materials Research Society	11 国際会議録 Defect distribution in large CZ-silicon wafers investigated by positron annihilation spectroscopy Mascher,P., Puff,W., Hahn,S., Cho,K.H., Lee,B.Y. Trans Tech Publications
6 国際会議録 Shallow Positron Traps in Gallium Arsenide Dannefaer,S., Mascher,P., Kerr,D. Trans Tech Publications	12 国際会議録 Influence of Oxygen and Oxygen Related Defects on the Minority Carrier Lifetime of High Purity CZ and MCZ Silicon Porrini, M., Gambaro, D., Geranzani, P., Falster, R. Electrochemical Society

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