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Automated inspection and dimension measurement of optoelectronic components

著者名:
  • Lim,T.-K. ( Nanyang Technological Univ.(Singapore) )
  • Swaminathan,S. ( Nanyang Technological Univ.(Singapore) )
  • Woo,C.K. ( EG & G Heimann Optoelectronics Pte.Ltd.(Singapore) )
  • Chan,C.N. ( Nanyang Technological Univ.(Singapore) )
  • Wong,Y.K. ( Nanyang Technological Univ.(Singapore) )
掲載資料名:
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3185
発行年:
1997
開始ページ:
32
終了ページ:
41
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426123 [0819426121]
言語:
英語
請求記号:
P63600/3185
資料種別:
国際会議録

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