Blank Cover Image

New approach for automatic recognition of melanoma in profilometry: optimized feature selection using genetic algorithms

著者名:
掲載資料名:
Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3338
発行年:
1998
巻:
Part 1
開始ページ:
684
終了ページ:
692
出版情報:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427830 [0819427837]
言語:
英語
請求記号:
P63600/3338
資料種別:
国際会議録

類似資料:

Ceisler,J., M.Littfaヲツ

SPIE - The International Society for Optical Engineering

G. H. Burgin, H. P. Kagey, J. C. Jatolla

Society of Photo-optical Instrumentation Engineers

Zomorodian, R., Khaledi, H., Ghofrani, M.B.

American Society of Mechanical Engineers

Huヲツmann,S., Kleuver,W., GUnther,B., Grdneweller,J., Rath,H.

SPIE - The International Society for Optical Engineering

Tao, H., Qian, K., Hung, C.-C., Gan, M., Liu, J., Bhattacharya, P.

SPIE-The International Society for Optical Engineering

Veprek, S., Wirschem, Th., Ruckschloヲツ, M., Tamura, H., Oswald, J.

MRS - Materials Research Society

DeRouin,E.E., Brown,J.R., Denney,G.

SPIE-The International Society for Optical Engineering

Li,J., Tsukamoto,H., Satofuka,N.

American Institute of Aeronautics and Astronautics

Miller, M.T., Jerebko, A.K., Malley, J.D., Summers, R.M.

SPIE-The International Society for Optical Engineering

Yang, S.J., Yoon, J.H., Ro, Y.M.

SPIE-The International Society for Optical Engineering

Kim,S.J., Lee,K., Kim,Y.I.

SPIE-The International Society for Optical Engineering

Roozbeh Zomorodian, Hiwa Khaledi, Mohammad Bagher Ghofrani

American Society of Mechanical Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12