Blank Cover Image

THE APPLICATION OF GODEL NUMBERS TO IMAGE ANALYSIS AND PATTERN RECOGNITION

著者名:
掲載資料名:
Pictorial data analysis
シリーズ名:
NATO ASI series. Series F, Computer and systems sciences
シリーズ巻号:
4
発行年:
1983
開始ページ:
87
終了ページ:
106
総ページ数:
20
出版情報:
Berlin: Springer-Verlag Berlin Heidelberg New York Tokyo
ISSN:
02581248
ISBN:
9783540122883 [3540122885]
言語:
英語
請求記号:
N11483/4
資料種別:
国際会議録

類似資料:

R. K. Reich, D. D. Rathman, D. M. O'Mara, D. J. Young, A. H. Loomis, R. M. Osgood, R. A. Murphy, M. Rose, R. Berger, B. …

SPIE - The International Society of Optical Engineering

Joo, W.-J., Choi, C.-S., Moon, I.K., Kim, N.

SPIE-The International Society for Optical Engineering

Reich, R.K., O'Mara, D.M., Young, D.J., Loomis, A.H., Rathman, D.D., Craig, D.M., Watson, S.A., Ulibarri, M.D., Kosicki, …

SPIE - The International Society of Optical Engineering

Hughes,G.W., Levin,P.A., McCaffey,N.J., Villani,T.S., O'Mara,K., Sjursen,W., Pantuso,F.P., Ambrose,J.G., King,B.

SPIE-The International Society for Optical Engineering

O'Mara, Robert L.

American Institute of Chemical Engineers

Valk de J. P. J.

Martinus Nijhoff Publishers

Siddiqui,K.J., Eastwood,D.

SPIE - The International Society for Optical Engineering

Gillespie, D. T., Hammons, H. K.

American Chemical Society

Siddiqui,K.J., Eastwood,D., Liu,Y.-H

SPIE - The International Society for Optical Engineering

Rosen,D., Phillips,W.C., Stanton,M.J., Xie,J., O'Mara,D.M., Stewart,A.X.

SPIE-The International Society for Optical Engineering

V. Megalooikonomou, J. Zhang, D. Kontos, P. R. Bakic

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12