"Theoretical Problems in Scanning Near-Field Optical Microscopy"
類似資料:
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
3
国際会議録
Near-field study of magneto-optical samples:theoretical comparison of transversal and polar effects
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
Kluwer Academic Publishers |
Kluwer Academic Publishers |