Reliability of High Speed HEMT integrated Circuits and Multi-2DEG Structures
- 著者名:
- Christou A. ( Foundation of Research and Technology-Hellas, Greece )
- 掲載資料名:
- Semiconductor device reliability
- シリーズ名:
- NATO ASI series. Series E, Applied sciences
- シリーズ巻号:
- 175
- 発行年:
- 1990
- 開始ページ:
- 545
- 終了ページ:
- 556
- 総ページ数:
- 12
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792305361 [0792305361]
- 言語:
- 英語
- 請求記号:
- N11482/175
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
MRS - Materials Research Society |
MRS - Materials Research Society |
Martinus Nijhoff Publishers |
Trans Tech Publications |
Martinus Nijhoff Publishers |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |