The Microstructure of GaAs/Si Films Studied as a Function of Heat Treatment
- 著者名:
Rocher A. Heral H. Charasse N. M. Georgakilas A. Chazelas J. Hirtz P. J. Blanck H. Siejka J. - 掲載資料名:
- Evaluation of advanced semiconductor materials by electron microscopy
- シリーズ名:
- NATO ASI series. Series B, Physics
- シリーズ巻号:
- 203
- 発行年:
- 1989
- 開始ページ:
- 347
- 終了ページ:
- 354
- 総ページ数:
- 8
- 出版情報:
- New York: Plenum Press
- ISBN:
- 9780306433627 [0306433621]
- 言語:
- 英語
- 請求記号:
- N11479/203
- 資料種別:
- 国際会議録
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